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Zahner CIMPS System

The Zahner CIMPS system is a highly-capable photo-electrochemistry workstation incorporating any variety of LED lightsources to run many types of experiments. The Zahner CIMPS has several unique features compared to competing options, notably an active-feedback sensor that measures intensity and adjusts the power applied to the lightsource automatically. The automatic comparison between the set value and sensed intensity eliminates the influence of non-linearity, ageing and temperature drift. Furthermore, it allows the direct calibration of the light source in units of intensity (W/m²). This method guarantees a precise intensity throughout the entire duration of an experiment, and for the entire lifetime of an LED lightsource.

Actively Controlled Light Intensity:

Most photo-electrochemistry systems rely solely on factory light-source calibration and assume stable output over time. In practice, heat and aging alter LED intensity, leading to measurement drift. Zahner’s Controlled Intensity architecture—denoted by the “C” in CIMPS—actively and automatically regulates light intensity in real time, ensuring accurate and repeatable measurements regardless of temperature or light-source aging.

Integrated, Plug-and-Play CIMPS System:

The CIMPS package is delivered as a fully calibrated, plug-and-play solution. A Zennium workstation functions as both frequency response analyzer and potentiostat/galvanostat. Users may select Zennium, Zennium Pro, or Zennium X based on experimental requirements. A slave PP-Series potentiostat controls light-source amplitude and modulation across a wide frequency range, while the optical bench integrates the light source, photo-amplifier, and photo-electrochemical cell (PECC-1 or PECC-2).

Because CIMPS includes a full Zennium workstation, the system remains highly versatile and can be used for conventional electrochemical measurements in addition to photo-electrochemical studies.

Supported Measurements:

  • SC fill-factor efficiency and maximum power

  • IMPS / CIMPS

  • IMVS / CIMVS

  • Charge extraction (Duffy, Peter et al.)

  • Light transient and time-domain measurements

  • DC vs. intensity transfer functions

  • Chopped light voltammetry

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